Nguyen HT, Le VL, Nguyen TM, Bui XK, Nguyen TG, Nguyen NL. Optical characterization of 2D heterostructure MoS2/WS2 using spectroscopic ellipsometry. JMST [Internet]. 2025 Feb. 21 [cited 2025 Feb. 22];101(101):117-23. Available from: https://online.jmst.info/index.php/jmst/article/view/1538